Prof. Xiaoqing Wen IEEE Fellow, Kyushu Institute of Technology
Xiaoqing Wen (Fellow, IEEE) received the B.E. degree in computer engineering from Tsinghua University, Beijing, China, in 1986, the M.E. degree in information engineering from Hiroshima University, Hiroshima, Japan, in 1990, and the Ph.D. degree in applied physics from Osaka University, Suita, Japan, in 1993.,From 1993 to 1997, he was an Assistant Professor with Akita University, Akita, Japan. He was a Visiting Researcher with the University of Wisconsin, Madison, WI, USA, from 1995 to 1996. He joined SynTest Technologies, Inc., Sunnyvale, CA, USA, in 1998, and worked as the Chief Technology Officer until 2003. In 2004, he joined the Kyushu Institute of Technology, Fukuoka, Japan, where he is currently a Professor and the Chair of the Department of Creative Informatics. He founded the Depend-Able Integrated Systems Research Center in 2015 and worked as the Director until 2017. He holds 43 U.S. patents and 14 Japanese patents on very large scale integration (VLSI) testing. He has co-authored and coedited two books, such as VLSI Test Principles and Architectures: Design for Testability (Morgan Kaufmann, 2006) and Power-Aware Testing and Test Strategies for Low Power Devices (Springer, 2009). His research interests include VLSI test, diagnosis, and testable design.,Dr. Wen is a member of the Institute of Electronics, Information and Communication Engineers (IEICE), the Information Processing Society of Japan, and the Reliability Engineering Association of Japan. He was a recipient of the 2008 IEICE-ISS Best Paper Award for his pioneering work on X-filling-based low-capture-power test generation. He currently serves as an Associate Editor for IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on VLSI Systems, and Journal of Electronic Testing: Theory and Applications.